The SkyScan 1272 instrument is a nondestructive micro-CT imaging technique that allows for high-resolution three-dimensional imaging of small objects. The instrument is comparable to medical CT scans but on a much smaller scale. Micro-CT utilizes X-rays to create detailed cross-sectional images of an object, providing valuable insights into its internal structure and composition. This technology is used in applications across various fields, including materials science, biology, engineering, and archaeology. By capturing a series of X-ray images from different angles, Micro-CT reconstructs a 3D model of the sample, enabling researchers to visualize and analyze its internal features. The technique is particularly useful for examining objects with complex or delicate structures that cannot be easily dissected or sectioned. Micro-CT has proven to be an indispensable tool for studying the microscopic world, enabling researchers to explore and understand the hidden intricacies of a wide range of samples.
For any sample, which can be up to 75mm in diameter, the system can optimize the X-ray energy and energy filtering using a new maintenance-free X-ray source and automatic 6-position filter changer. The system also includes a built-in precision micro-positioning stage. We do have an optional 16-position automatic sample changer that allows for multi-sample data collection (maximum sample diameter of 15 mm).
For the fastest data collection times on this instrument (20-40 minutes), samples less than 10 mm in diameter are ideal. For materials larger or more X-ray dense (rock or minerals), data collection time can vary from 3-10 hours, depending on image quality settings. If you have any questions about the instrument or would like a consultation about your specific sample(s), please contact Dr. Daniel Unruh.
Technical specifications for the SkyScan 1272
X-ray source 20-100kV,10W, <5µm spot size @ 4W
X-ray detector 11Mp, 14-bit cooled CCD fiber-optically coupled to a scintillator
Maximum object size 75mm in diameter using offset scan (27mm in fast single scan)
Detail detectability 0.45um (11Mp) at highest magnification
Optional stages Cooling, heating, compression/tension (not available in MATFab)
Radiation safety <1 µSv/h at 10cm from the instrument surface
This instrument is located in IATL 196 and is managed by Dr. Daniel Unruh.