X-ray Fluorescence Spectrometry (XRF) enables elemental analysis on a wide range of materials.  The Rigaku ZXS Primus IV is a tube-above sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer.  It can determine major and minor element composition of solids, powders, thin-films, and alloys.  The system has multi-spot and mapping capabilities to evaluate heterogeneous materials.

Standard Features on the Rigaku XRF system

  • Analysis of elements from Be to U
  • ZSX Guidance expert system software
  • Digital multi-channel analyzer (D-MCA)
  • EZ Analysis interface for routine measurements
  • Tube above optics minimizes contamination issues
  • Micro analysis to analyze samples as small as 500 µm
  • 30μ tube for superior light element performance
  • Mapping feature for elemental topography/distribution

This instrument is located in IATL 196 and is managed by Kenny Horkley.

Use BookitLab to reserve this instrument